Electrical engineer with more than two decades of experience in precision electromagnetic measurements, antenna characterization, and RF/microwave systems testing. Specialized expertise in spherical near-field antenna scanning techniques, quiet-zone field evaluation, and antenna test range imaging. This expert has authored peer-reviewed publications in leading IEEE conferences on antenna metrology and measurements, and possesses extensive intellectual property expertise including patent review, reverse engineering, and evidence-of-use analysis. Currently provides technical consulting on antenna measurement systems, RF spectrum analysis, and electromagnetic metrology challenges.
Formal Education
- Ph.D. in Electrical Engineering from University of Colorado
- Master of Science in Electrical Engineering from University of Colorado
- Bachelor of Science in Electrical Engineering from University of Colorado
Career Highlights
- Postdoctoral researcher at a prominent national laboratory: Researched broadband modulated signals at millimeter-wave frequencies and developed measurement techniques for RF systems operating from 45 GHz to 150 GHz
- Electronics Engineer at a leading federal research institution: Developed algorithms and software for holographic millimeter-wave imaging and performed near-field antenna measurements with spherical scanning methodology
- Principal Investigator at a major defense contractor: Led development of an FPGA-based RF spectrum analyzer for SATCOM missions capable of rapid signal measurement in the L-band frequency range
- Technical consultant at a federal research laboratory's Antenna Measurement Laboratory: Developed and maintained software for spherical near-field to far-field calculations and provided numerical analysis support
- Technology consultant: Designed advanced control systems and computer vision algorithms for autonomous systems, including real-time signal processing for target identification and navigation
Expert Qualifications
- Published author in peer-reviewed leading academic conferences on antenna measurements, including research on quiet-zone field evaluation, antenna test range imaging, and chamber imaging using spherical near-field scanning
- Extensive intellectual property expertise: Reviewed hundreds of patents, drafted claim charts and evidence-of-use analyses, reverse-engineered products including binary code extraction and executable disassembly
- Subject matter expert across RF/microwave measurement systems, antenna characterization, and electromagnetic metrology—well-positioned to provide expert testimony on antenna performance disputes, wireless system validation, and measurement infrastructure challenges
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Frequently Asked Questions
What types of cases can this expert support?
This expert can support cases involving antenna performance, wireless system validation, and RF measurement infrastructure. They have experience with antenna measurement disputes, RF spectrum analysis conflicts, and SATCOM system design. Their IP analysis background—patent review, reverse engineering, claim charts—is also useful for cases where measurement methodology or equipment performance is key.
What is this expert's technical background?
They have a PhD, MS, and BS in electrical engineering from University of Colorado. Their career has been antenna measurement and RF systems: postdoctoral work on millimeter-wave frequencies (45-150 GHz), federal lab experience with holographic millimeter-wave imaging and spherical scanning, FPGA RF spectrum analyzer development for SATCOM, and consulting on antenna measurement infrastructure.
What technologies does this expert specialize in?
Spherical near-field antenna scanning, RF spectrum analysis, near-field to far-field transformation, millimeter-wave imaging, FPGA design, electromagnetic metrology, and SATCOM systems. They also have real-time signal processing and computer vision experience from autonomous systems work.
- Spherical near-field antenna scanning
- RF spectrum analysis
- FPGA design and implementation
- Millimeter-wave imaging
- Real-time signal processing
- Electromagnetic metrology
- Satellite communications systems
- Antenna pattern characterization
- U.S. District Courts
- Patent Trial and Appeal Board
- International Trade Commission